Elimination of Crumpled Leadframe Defect through Machine Sensor Enhancement

Jonathan C. Pulido *

New Product Development & Introduction, STMicroelectronics, Inc., Calamba City, Laguna, 4027 Philippines.

Edwin M. Graycochea Jr.

New Product Development & Introduction, STMicroelectronics, Inc., Calamba City, Laguna, 4027 Philippines.

Frederick Ray I. Gomez

New Product Development & Introduction, STMicroelectronics, Inc., Calamba City, Laguna, 4027 Philippines.

*Author to whom correspondence should be addressed.


Abstract

The paper focused on the improvement done in quad-flat no-leads (QFN) leadframe package assembly to address the quantity of rejection of crumpled leadframe during handling at wirebond process station. Overload sensor at the output magazine handler was found out to be defective, hence a new sensor was installed. With the improvement done, crumpled leadframe strip occurrence was ultimately eliminated.

Keywords: Assembly, crumpled leadframe, QFN, wirebonding.


How to Cite

Pulido, Jonathan C., Edwin M. Graycochea Jr., and Frederick Ray I. Gomez. 2020. “Elimination of Crumpled Leadframe Defect through Machine Sensor Enhancement”. Journal of Engineering Research and Reports 19 (2):16-19. https://doi.org/10.9734/jerr/2020/v19i217226.

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