Ball Crack Mitigation through Wirebond Process Optimization
Anthony R. Moreno *
New Product Development & Introduction, STMicroelectronics, Inc., Calamba City, Laguna-4027, Philippines.
Frederick Ray I. Gomez
New Product Development & Introduction, STMicroelectronics, Inc., Calamba City, Laguna-4027, Philippines.
Rennier S. Rodriguez
New Product Development & Introduction, STMicroelectronics, Inc., Calamba City, Laguna-4027, Philippines.
*Author to whom correspondence should be addressed.
Abstract
Intermetallic is a critical factor that is controlled and limit during manufacturing of integrated units. Through improving the ball flatness response of the semiconductor wire significantly impact the outcome for the intermetallic characteristic between metal such as Gold-Aluminum connection. The implementation of this study on the actual manufacturing control eliminates escapee of poor intermetallic that would impact the reliability and integrity of the package upon its application to the end product.
Keywords: Ball crack, design of experiments, intermetallic, wirebond process.