Journal of Engineering Research and Reports

Glass material used on a semiconductor device for isolating currents are one of the new breakthroughs of the modern world. Challenges are inevitable due to its complex characteristics and unique appearance. The study focuses on the phenomenon of reject glass die unrecognized, picked and bonded by die attach machine on good units of the semiconductor quad-flat no-leads (QFN) device in focus. This QFN device utilizes glass die as interposer on two active dice that separates the dielectric current of each die. During die attach process, machine photo recognition system failed to recognize and detect the glass die reject marking due to its unique transparent design and will be attached on good units. Thus, resulting to gross rejection and low process yield. Practical solutions to prevent the said phenomenon are simulated and determined by performing selection of variables like the contrast of the reject mark related to the product structure and compatibility through statistical analysis. The improvement drives to promote process robustness and scrap reduction that will help the manufacturing to be competitive through innovative resolutions on problems.